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THERMAL CONDUCTIVITY

C-THERM TCi

Principles of Operation
Modified Transient Plane Source Technique

The C-Therm TCi Thermal Conductivity Analyzer employs the Modified Transient Plane Source (MTPS) technique in characterizing the thermal conductivity and effusivity of materials. It employs a one-sided, interfacial heat reflectance sensor that applies a momentary constant heat source to the sample. Typically, the measurement pulse is between 1 to 3 seconds. Thermal conductivity and effusivity are measured directly, providing a detailed overview of the heat transfer properties of the sample material.

HOW IT WORKS

SPECIFICATIONS


Test Methods	Modified Transient Plane Source (MTPS)	Transient Line Source (TLS)
Thermal Conductivity Range	0 to 500 W/mK	0.1 to 6 W/mK
Thermal Effusivity Range	5 to 40,000 Ws½/m²K	N/A
Test Time	0.8 to 3 seconds
Minimum Sample Testing Size	0.67" (17mm) diameter	80ml
Maximum Sample Testing Size	Unlimited
Minimum Thickness	Nominally 0.02" (0.5mm), dependent on thermal conductivity of material	N/A
Maximum Thickness	Unlimited
Temperature Range	-58º to 392ºF (-50º to 200ºC) With option to extend to 500ºC	-67º to 392ºF (55º to 200ºC)
Precision	Better than 1%	Better than 1%
Accuracy	Better than 5%	± (3% + 0.02) W/mK
Extra Hook-ups Required	None
Software	Intuitive Windows®-based software interface Easy export to Microsoft Excel® Additional functionality offers indirect, user-input capabilities for a number of other thermo-physical properties including: Thermal Diffusivity Heat Capacity Density
Input Power	110-230 VAC 50-60 Hzd
Certifications	FCC, CE, CSA
International Standards	Conforms to ASTM D7984	Conforms to ASTM D5334, D5930, and IEEE 442-1981

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